VARIABLE DELAY ELEMENT INSPECTION CIRCUIT,申请号JP19970264098-传众专利搜索

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发明名称	VARIABLE DELAY ELEMENT INSPECTION CIRCUIT
摘要
申请公布号	JPH11101852(A)	申请公布日期	1999.04.13
申请号	JP19970264098	申请日期	1997.09.29
申请人	TOSHIBA CORP	发明人	KOBAYASHI NORIFUMI
分类号	G01R31/28;(IPC1-7):G01R31/28	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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