发明名称 |
USE OF MODULATED INDUCTIVE POWER AND BIAS POWER TO REDUCE OVERHANG AND IMPROVE BOTTOM COVERAGE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method and device for realizing an appropriate step coverage for one or more kinds of materials on a substrate by using a sputtered and ionized material. SOLUTION: A plasma is generated and maintained inside a treatment region by coupling energy to one or more kinds of gases. A target 104 disposed inside a treatment region 107 provides a material source which is sputtered and thereafter ionized in plasma atmosphere. During deposition on a substrate 110, the density of the plasma is modulated by changing energy supplied to the plasma. During plasma attenuation, bias to a substrate support member 112 is increased to a relative high power for reinforcing force to attract particle charged positive to the substrate 110 periodically in an afterglow period of the plasma. In one example, a bias to a target is also modulated. |
申请公布号 |
JP2001284286(A) |
申请公布日期 |
2001.10.12 |
申请号 |
JP20000319620 |
申请日期 |
2000.10.19 |
申请人 |
APPLIED MATERIALS INC |
发明人 |
FORSTER JOHN C;GOPALRAJA PRABURAM |
分类号 |
H05H1/46;C23C14/34;C23C14/35;H01J37/32;H01J37/34;H01L21/203;H01L21/205;H01L21/285 |
主分类号 |
H05H1/46 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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