| 摘要 |
The registered signal is evaluated by data processing on the basis of the time lapse since termination of the modulation, a frequency and/or amplitude of the reflected and/or emitted light, and one area dimension relating to the surface under test. The sensor is especially a lead-zinc-selenite element and/or an si-element in the spectral range between 0.3 and 14 microns. In non-destructive non-contact process and assembly test the surface condition of a welded, coated and/or laminar material work-piece, a pre-determined part of the surface is exposed to a pulse-modulated infra-red beam. After termination of the pulse modulation, the surface emission and reflection properties of the surface are registered and compensated as required, by means of the reflected, absorbed and/or emitted light for a pre-determined period.
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