发明名称 Semiconductor device and method for fabricating the same
摘要 A semiconductor device includes a transistor of a first conductivity type and a transistor of a second conductivity type. The transistor of the first conductivity type includes a first gate portion formed on a first region of a semiconductor substrate, a first sidewall formed on each side face of the first gate portion, a first protecting film formed between the first sidewall and the first gate portion, and an extension diffusion layer of the first conductivity type. The transistor of the second conductivity type includes a second gate portion formed on a second region of the semiconductor substrate, a second sidewall formed on each side face of the second gate portion, a second protecting film having an L-shaped cross-section and formed between the second sidewall and the second gate portion and between the second sidewall and the semiconductor substrate, and an extension diffusion layer of the second conductivity type.
申请公布号 US7271414(B2) 申请公布日期 2007.09.18
申请号 US20060336970 申请日期 2006.01.23
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 TAMURA NOBUYUKI;KISHIMOTO TAKEHISA;SEGAWA MIZUKI
分类号 H01L31/112;H01L27/082 主分类号 H01L31/112
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