发明名称 Semiconductor devices and methods for manufacturing the same
摘要 Certain embodiments of the present invention relate to a semiconductor device that has a pad section having an excellent coherency with an interlayer dielectric layer, and a method for manufacturing the same. A semiconductor device 1000 has a pad layer 30A formed over an interlayer dielectric layer 20. The interlayer dielectric layer 20 includes at least a first silicon oxide layer 20b that is formed by a polycondensation reaction of a silicon compound and hydrogen peroxide, and a second silicon oxide layer 20c formed over the first silicon oxide layer and containing an impurity. The pad section 30A includes a wetting layer 32, an alloy layer 34 and a metal wiring layer 37.
申请公布号 US2001033028(A1) 申请公布日期 2001.10.25
申请号 US20010818743 申请日期 2001.03.27
申请人 MATSUMOTO KAZUMI;MOROZUMI YUKIO;ASAHINA MICHIO 发明人 MATSUMOTO KAZUMI;MOROZUMI YUKIO;ASAHINA MICHIO
分类号 H01L23/52;H01L21/316;H01L21/3205;H01L21/60;H01L21/768;H01L23/485;(IPC1-7):H01L21/44;H01L21/31;H01L21/469;H01L23/48;H01L29/40 主分类号 H01L23/52
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