发明名称 Device for the nondestructive examination of a plurality of junction parts.
摘要 <p>-Device for riveted or similar junction parts, each of the said parts being individually identifiable by virtue of means of identification, the said device comprising at least one electrical detection probe (23), which is movable along the said junction parts (7). - According to the invention, this device comprises memory means (43) containing, for each junction part, its specific composition and, for each specific junction part composition, the operating adjustment to be applied to the said probe, and a microprocessor (36) uses the contents of the said memory means in order to control the said probe (23) on the basis of the specific composition of the junction part under examination. &lt;IMAGE&gt;</p>
申请公布号 EP0474521(A1) 申请公布日期 1992.03.11
申请号 EP19910402003 申请日期 1991.07.17
申请人 AEROSPATIALE SOCIETE NATIONALE INDUSTRIELLE SOCIETE ANONYME DITE: 发明人 FLORET, MICHEL
分类号 G01N27/90 主分类号 G01N27/90
代理机构 代理人
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