发明名称 |
Employing on die temperature sensors and fan-heatsink failure signals to control power dissipation |
摘要 |
A circuit and method for reducing an internal clocking frequency of the semiconductor device upon receiving a first signal indicating that a fan element disposed on the semiconductor device is operating at an unacceptable performance level and/or a second signal indicating that the semiconductor device is operating at a temperature greater than a prescribed boundary temperature. |
申请公布号 |
AU2512195(A) |
申请公布日期 |
1995.12.05 |
申请号 |
AU19950025121 |
申请日期 |
1995.05.09 |
申请人 |
INTEL CORPORATION |
发明人 |
JAMES R NEAL;PETER F BROWN;LOUIS W AGATSTEIN;MICHAEL GUTMAN |
分类号 |
G06F1/20;G06F1/32 |
主分类号 |
G06F1/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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