发明名称 METHOD AND SYSTEM FOR ELECTRON SCANNING ULTRASONIC INSPECTION
摘要 PURPOSE: To discriminate between a real image formed by a main beam and a virtual image formed by grating globe easily with no error. CONSTITUTION: A receiving signal from an array type probe 1 is delayed and added and then split into two signals which are passed, respectively, through filters 31a, 31b having different frequency band. They are then fed, respectively, to signal processing circuits 26a, 26b where the peak value and propagation time are measured respectively. The measurements are held, along with the positional information of the probe 1, in a memory 28. After a specimen is scanned, the intensity of echo caused by the split signal and the position of echo source are determined based on each peak value, propagation time and the positional information of probe held on the memory 28. The positions of respective echo sources are presented individually on an image display 29.
申请公布号 JPH08327613(A) 申请公布日期 1996.12.13
申请号 JP19950132254 申请日期 1995.05.30
申请人 HITACHI LTD;HITACHI CONSTR MACH CO LTD 发明人 YAMAKOSHI ATSUSHI;KOIKE MASAHIRO;TAKESUTE YOSHINORI;MICHIGUCHI YOSHIHIRO
分类号 G01N29/44;G01N29/22;G01N29/24;G01N29/26 主分类号 G01N29/44
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