发明名称 |
Thermal analyzer and a method of measuring with the same |
摘要 |
A thermal analyzer scans temperature by thermally altering a sample and measuring a thermal change based on physical and chemical changes of the sample as a function of time and/or temperature. The thermal analyzer includes a heat-generating section for heating a sample. The heat-generating section includes a first semiconductor substrate of a first conductivity type forming a thin-film heater with a cavity section in a lower section thereof and a second semiconductor substrate of a second conductivity type connected to the first substrate. The cavity section forms a sample holding section for holding the sample. The thermal analyzer further includes a temperature detecting section for detecting a temperature of the sample holding section. The sample holding section and the temperature detecting section are monolithically formed on the thin-film heater or an area proximate the thin-film heater in a thin-film supporting section for supporting the thin-film heater.
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申请公布号 |
US6331074(B1) |
申请公布日期 |
2001.12.18 |
申请号 |
US19980008081 |
申请日期 |
1998.01.16 |
申请人 |
RICOH COMPANY, LTD. |
发明人 |
KIMURA MITSUTERU |
分类号 |
G01R33/12;G01N5/04;G01N25/00;G01N25/20;G01N25/48;G01N27/72;(IPC1-7):G01N25/00 |
主分类号 |
G01R33/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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