发明名称 |
Methods of program-verifying a multi-bit nonvolatile memory device and circuit thereof |
摘要 |
Methods of verifying a program state may be provided for a non-volatile memory device including a multi-bit memory cell transistor providing more than two different program states. More particularly, the multi-bit memory cell transistor may be programmed from a first program state to a second program state, and a reference memory cell corresponding to the second program state may be selected. After programming the multi-bit memory cell transistor to the second program state and after selecting the reference memory cell corresponding to the second program state, a current flowing through the multi-bit memory cell transistor programmed to the second memory state and a current flowing through the reference memory cell may be compared. Programming the multi-bit memory cell transistor to the second program state may then be verified responsive to comparing the currents flowing through the multi-bit memory cell and the reference memory cell.
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申请公布号 |
US7327609(B2) |
申请公布日期 |
2008.02.05 |
申请号 |
US20050241291 |
申请日期 |
2005.09.30 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM BO-GEUN;LEE SEUNG-KEUN |
分类号 |
G11C16/34 |
主分类号 |
G11C16/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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