发明名称 |
System for sampling and analysing gas |
摘要 |
<p>The system (1) has a pump (5) admitting a gas at a pressure that is less than an inlet pressure of a gas analyzer (4) e.g. ionic mobility spectrometer. An enclosure (3) contains an inner atmosphere at a pressure less than atmospheric pressure. A conductance controller (7) e.g. pressure controller, is placed at a delivery side of the pump and produces a gaseous flow of constant value and of same order of amplitude as that of a pumping speed of a sampling pump of the analyzer. A relief valve (6) permits to impose another pressure that is greater than the inlet pressure of the analyzer. An independent claim is also included for a method for sampling a gas sample in an enclosure by using a gas sampling and analyzing system.</p> |
申请公布号 |
EP1884761(A1) |
申请公布日期 |
2008.02.06 |
申请号 |
EP20070113464 |
申请日期 |
2007.07.30 |
申请人 |
ALCATEL LUCENT |
发明人 |
FORAY, JEAN-MARIE;GODOT, ERWAN |
分类号 |
G01N1/00;G01N33/00 |
主分类号 |
G01N1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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