Inductive position or angle measurement device

摘要

The device has a measuring oscillator with a measuring coil changing a pulse frequency of the oscillator based on inductance changes produced by a movable measuring unit depending on an overlapping rate between the coil and the unit. A measuring-or reference oscillator has a measuring-or reference coil that is defined to either completely cover or uncover the reference coil by the unit, so that a pulse frequency of the reference oscillator does not depend on the rate. The frequencies are counted and set in a digital evaluation circuit e.g. application specific integrated circuit (ASIC).