发明名称 POLISHING PAD, METHOD OF PRODUCING THE SAME AND METHOD OF PRODUCING SEMICONDUCTOR DEVICE BY USING THE SAME
摘要 The present invention provides a polishing pad used for planarizing inter layer dielectrics and the like by CMP (chemical mechanical polishing) in the manufacturing process of a semiconductor device, a method of producing the polishing pad and a method of producing a semiconductor device by using the polishing pad. The present invention relates to a semiconductor wafer polishing pad having grooves in a polishing surface and formed from a foamed polyurethane, wherein a processed surface of the groove comprising a side surface and a bottom surface has a surface roughness Ra of not more than 10.
申请公布号 US2009075568(A1) 申请公布日期 2009.03.19
申请号 US20060912092 申请日期 2006.02.24
申请人 TOYO TIRE & RUBBER CO., LTD. 发明人 KIMURA TSUYOSHI;NAKAI YOSHIYUKI;WATANABE MASAHIRO
分类号 B24D11/00;B23B5/00;B23B5/46;B24B1/00;B24B7/20;B24B37/20;B24D18/00;H01L21/304 主分类号 B24D11/00
代理机构 代理人
主权项
地址