| 摘要 |
FIELD: measurement technology.SUBSTANCE: invention relates to methods of examination of woody plants. Summary: substrate with a white surface is laid from the bottom on the measured leaf, and from above is transparent palette for cartographic measurements. At that, the longitudinal axis of the plant leaf is combined with one of the palette grid lines. Then the sheet is photographed through the transparent palette with the grid, and the image is placed in computer memory. Parameters of leaf are measured by meshes of the palette grid on the magnified image of the sheet. At that, on the side surface of tree top local zone with approximately identical solar illumination is identified, on which group of accounted leaves with marks is selected. Accounted leaves parameters measuring is performed during vegetation period on daily basis from the beginning of leaves bud bursting with photographing each accounted leaf. During vegetation period accounted leaves parameters measuring is performed several times. Then in group by all accounted leaves, taken on one local zone of tree top surface, using statistical modelling average statistical regularities of accounted leaves recorded parameters by separate leaves, growing on one local zone of tree top surface growth dynamics is identified.EFFECT: broader functional capabilities.11 cl, 12 dwg, 6 tbl |
