发明名称 METHOD FOR FORMING METAL WIRING MATERIAL
摘要 PURPOSE:To improve surface smoothness by maintaining a substrate temperature to a specific temperature or higher when forming a metal wiring material by forming a second metal layer on a first metal layer. CONSTITUTION:A contact hole a is made in an insulation film 2 formed on a substrate 1. Then, a first metal layer 5 is formed on the insulation film 2 so that a contact hole (a) is filled in but a deposition layer 4 which improves the adhesion property of the first metal layer 5 and at the same time has a barrier function between the insulation film 2 and the first metal layer is preferably formed on the insulation film 2 and the first metal layer 5 is formed on the adhesion layer 4. A second metal layer 7 is formed on the first metal layer 5 preferably via an adhesion layer 6 by a high-temperature sputtering with a substrate temperature of 400 deg.C or higher as a wiring material, thus improving the surface smoothness.
申请公布号 JPH07130852(A) 申请公布日期 1995.05.19
申请号 JP19930297389 申请日期 1993.11.02
申请人 SONY CORP 发明人 SHINOHARA KEIJI
分类号 H01L21/28;H01L21/3205;H01L21/768;H01L23/485;H01L23/52;H01L23/532;(IPC1-7):H01L21/768;H01L21/320 主分类号 H01L21/28
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