METHOD FOR DISPLAYING IDENTIFICATION MARK OF SEMICONDUCTOR WAFER

摘要

PURPOSE: A method for displaying an identification mark of a semiconductor wafer is provided to easily manage the wafer, by uniformly determining identification marks so that a user can easily understand information regarding the wafer. CONSTITUTION: A series of marks corresponding to the specification of the semiconductor wafer are defined. The marks are displayed on the surface of the semiconductor wafer. The marks include a series of letters or numbers which indicate a grade and use of the semiconductor wafer, a production month and year, the serial number of the semiconductor wafer, the number of times of a regeneration process and the title of a manufacturer.