发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE |
摘要 |
A semiconductor integrated circuit device such that the problems of performance deterioration and malfunction of the circuit are solved. As shown in the figure, guard bands (6a and 6b) surrounding either an analog section (1) or digital section are formed in the front of an integrated circuit substrate, and the conductor sections (4a and 4b) of the analog and digital sections (1 and 2) are provided on the back of the circuit substrate. The conductor section (4b) of the digital section (2) is set at a virtual grounding potential bythe feeding backing of an amplifier circuit (7a). As a result, substrate noise produced from the digital section (2) is offset and the influence of the digital noise transmitted to the analog section (1) is reduced.
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申请公布号 |
WO9812750(A1) |
申请公布日期 |
1998.03.26 |
申请号 |
WO1996JP02722 |
申请日期 |
1996.09.20 |
申请人 |
HITACHI, LTD.;TSUKADA, TOSHIRO;FUKUDA, KEIKO;MAEDA, SATOSHI |
发明人 |
TSUKADA, TOSHIRO;FUKUDA, KEIKO;MAEDA, SATOSHI |
分类号 |
H01L27/02;(IPC1-7):H01L27/04;H01L21/822 |
主分类号 |
H01L27/02 |
代理机构 |
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