发明名称 MRAM memory cell
摘要 The invention relates to an MRAM memory cell including a magnetoresistive resistor and a switching transistor. The magnetoresistive resistor is located between a central metallization plane and an upper metallization plane. The central metallization plane serves for the word line stitch and also for writing. A word line BOOST circuit is provided in the stitch region of each cell, with the result that the critical voltage is not reached in the magnetoresistive resistor and the switching transistor can nevertheless be turned on.
申请公布号 US2002008989(A1) 申请公布日期 2002.01.24
申请号 US20010907778 申请日期 2001.07.18
申请人 HONIGSCHMID HEINZ 发明人 HONIGSCHMID HEINZ
分类号 G11C11/14;G11C11/15;G11C11/16;H01L21/8246;H01L27/105;H01L27/22;H01L43/08;(IPC1-7):G11C11/00 主分类号 G11C11/14
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