发明名称 MEASURING METHOD OF CHROMATICITY OR ILLUMINANCE, AND MEASURING SYSTEM OF CHROMATICITY OR ILLUMINANCE
摘要 PROBLEM TO BE SOLVED: To provide a measuring system of chromaticity or illuminance capable of measuring highly accurately, when measuring the chromaticity or the illuminance of a beam emitted from a light source by using a colorimeter. SOLUTION: This measuring system of chromaticity or illuminance for measuring the chromaticity or the illuminance of the beam emitted from the light source 100 is equipped with the colorimeter 10 for measuring the chromaticity or the illuminance of the beam emitted from the light source, and correction means 33, 34 for correcting a measured value of the colorimeter 10 based on a calibration value of the colorimeter 10 set corresponding to the wavelength of the beam measured by the colorimeter 10. As the calibration value corresponding to the wavelength of the beam at the measurement time by the colorimeter 10 can be used, the measured value can be corrected highly accurately.
申请公布号 JP2001324386(A) 申请公布日期 2001.11.22
申请号 JP20000141715 申请日期 2000.05.15
申请人 SEIKO EPSON CORP 发明人 YAMAGISHI HIDEKAZU;AOYANAGI FUMIO
分类号 G01J3/50;G01J3/46;(IPC1-7):G01J3/50 主分类号 G01J3/50
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