发明名称 Post exposure resist bake
摘要 A preferred embodiment of the invention provides a method for forming an integrated circuit. The method comprises forming a resist layer on a substrate. Preferably, the photoresist layer comprises a photo acid generator (PAG). Embodiments include irradiating the resist through a mask to generate a photoacid in the resist, heating the resist at a first temperature, and then heating the resist at a second temperature. Heating at the first temperature evaporates water from the resist. Heating at the second temperature deprotects the resist.
申请公布号 US2007099429(A1) 申请公布日期 2007.05.03
申请号 US20050262420 申请日期 2005.10.28
申请人 BRANDL STEFAN 发明人 BRANDL STEFAN
分类号 H01L21/302;H01L21/461 主分类号 H01L21/302
代理机构 代理人
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