发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor substrate capable of improving crystallinity in the crystal layer of a group III nitride semiconductor. SOLUTION: The manufacturing method of the semiconductor substrate related to a first aspect includes: a chromium layer film formation process for film-forming a chromium layer on a base substrate at not less than 50°C temperature; and a nitriding process for nitriding the chromium layer for forming a chromium nitride film. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2008091729(A) |
申请公布日期 |
2008.04.17 |
申请号 |
JP20060272323 |
申请日期 |
2006.10.03 |
申请人 |
TOHOKU TECHNO ARCH CO LTD;FURUKAWA CO LTD;MITSUBISHI CHEMICALS CORP;DOWA ELECTRONICS MATERIALS CO LTD;EPIVALLEY CO LTD |
发明人 |
YAO TAKAFUMI;CHIYO MEIKAN |
分类号 |
H01L21/20;C30B25/18;C30B29/38 |
主分类号 |
H01L21/20 |
代理机构 |
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