发明名称 |
ENHANCED T2*-CONTRAST IN HALF-FOURIER MAGNETIC RESONANCE IMAGING |
摘要 |
The invention relates to an MR method for imaging an object. During measurement of MR signals by application of gradients, a measuring plane is sampled along a trajectory which is asymmetrically situated in the k-space and contains a center of the k-space. In order to reduce the acquisition time while retaining a long echo time, the trajectory in the k-space is sampled in such a manner that a distance between a starting point and the center of the k-space is greater than a distance between an end point and the center of the k-space.
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申请公布号 |
WO0037956(A1) |
申请公布日期 |
2000.06.29 |
申请号 |
WO1999EP09819 |
申请日期 |
1999.12.13 |
申请人 |
KONINKLIJKE PHILIPS ELECTRONICS N.V. |
发明人 |
VAN DEN BRINK, JOHAN, S. |
分类号 |
G01R33/54;(IPC1-7):G01R33/561 |
主分类号 |
G01R33/54 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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