发明名称 ENHANCED T2*-CONTRAST IN HALF-FOURIER MAGNETIC RESONANCE IMAGING
摘要 The invention relates to an MR method for imaging an object. During measurement of MR signals by application of gradients, a measuring plane is sampled along a trajectory which is asymmetrically situated in the k-space and contains a center of the k-space. In order to reduce the acquisition time while retaining a long echo time, the trajectory in the k-space is sampled in such a manner that a distance between a starting point and the center of the k-space is greater than a distance between an end point and the center of the k-space.
申请公布号 WO0037956(A1) 申请公布日期 2000.06.29
申请号 WO1999EP09819 申请日期 1999.12.13
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 VAN DEN BRINK, JOHAN, S.
分类号 G01R33/54;(IPC1-7):G01R33/561 主分类号 G01R33/54
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