发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device in which the temperature of a semiconductor element can be detected precisely by reducing the detection temperature difference between the temperature of the semiconductor element and the temperature of a thermistor. SOLUTION: The semiconductor device is formed, in such a way that an external cooling fin and an insulating substrate comprising metal layers fixed and bonded to main faces on both sides are bonded via a support substrate fixed and are bonded to the main face on one side of the insulating substrate. In the semiconductor device, the semiconductor element and a temperature detecting body are electrically connected to the metal layer fixed and are bonded to the main face on the other side of the insulating substrate. |
申请公布号 |
JP2002076236(A) |
申请公布日期 |
2002.03.15 |
申请号 |
JP20000267784 |
申请日期 |
2000.09.04 |
申请人 |
HITACHI LTD;HITACHI HARAMACHI SEMICONDUCTOR LTD |
发明人 |
HAYAKAWA SEIICHI;SAITO KATSUAKI;ISHIKAWA KATSUMI;SASAKI ATSUSHI;SUDA KOICHI;BANDO AKIRA |
分类号 |
H01L23/58;H02M1/00;H02M7/48 |
主分类号 |
H01L23/58 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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