发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device in which the temperature of a semiconductor element can be detected precisely by reducing the detection temperature difference between the temperature of the semiconductor element and the temperature of a thermistor. SOLUTION: The semiconductor device is formed, in such a way that an external cooling fin and an insulating substrate comprising metal layers fixed and bonded to main faces on both sides are bonded via a support substrate fixed and are bonded to the main face on one side of the insulating substrate. In the semiconductor device, the semiconductor element and a temperature detecting body are electrically connected to the metal layer fixed and are bonded to the main face on the other side of the insulating substrate.
申请公布号 JP2002076236(A) 申请公布日期 2002.03.15
申请号 JP20000267784 申请日期 2000.09.04
申请人 HITACHI LTD;HITACHI HARAMACHI SEMICONDUCTOR LTD 发明人 HAYAKAWA SEIICHI;SAITO KATSUAKI;ISHIKAWA KATSUMI;SASAKI ATSUSHI;SUDA KOICHI;BANDO AKIRA
分类号 H01L23/58;H02M1/00;H02M7/48 主分类号 H01L23/58
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