发明名称 Offset measuring method
摘要 An offset measuring method is for measuring an offset based on an optical beam reflected by an information medium, in a recording and reproduction apparatus including an optical pickup placed on transportation means so as to be driven along a radial direction of the information medium. The method includes the steps of directing an optical beam toward a first measuring position, thereby measuring a first offset amount based on the optical beam reflected at the first measuring position; moving the transportation means by a first distance in a first direction along the radial direction; driving the optical pickup by a second distance, which is equal to the first distance, in a second direction; and directing an optical beam toward a second measuring position, thereby measuring a second offset amount based on the optical beam reflected at the second measuring position.
申请公布号 US7035175(B2) 申请公布日期 2006.04.25
申请号 US20020221877 申请日期 2002.09.16
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 KITAYAMA MACHIKO;KUWAHARA MASAYA;TAI YASUHIRO
分类号 G11B7/085;G11B7/095;G11B7/09 主分类号 G11B7/085
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