| 摘要 |
The present invention provides a ROM test circuit capable of shortening a test time and a test method therefor. When data written into a plurality of ROMs are tested, data of the ROM( 1 ) and ROM( 2 ) are selected based on the output data of the specific ROM( 3 ). Then, the selected data are compared with expected values to thereby perform testing thereof. Therefore, the contents of the ROM( 3 ) are also tested within the time required to test each of the ROM( 1 ) and ROM( 2 ), thus making it possible to shorten a test time.
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