发明名称 Method of manufacturing a semiconductor device
摘要 A method of manufacturing a semiconductor device provided with a first insulating film and a barrier film on a conductive region and an opening portion in the first insulating film and the barrier film, the method comprising the steps of: forming a first opening portion in the barrier film reaching the first insulating film; forming a second insulating film at least on the first insulating film in the first opening portion; and forming a second opening portion smaller than the first opening portion and reaching the conductive region by simultaneously boring a hole into the first insulating film and the second insulating film in the first opening portion.
申请公布号 US2002039837(A1) 申请公布日期 2002.04.04
申请号 US20010908496 申请日期 2001.07.19
申请人 TOHDA TOSHIYUKI;ARII ISAKU 发明人 TOHDA TOSHIYUKI;ARII ISAKU
分类号 H01L21/302;H01L21/28;H01L21/3065;H01L21/311;H01L21/768;(IPC1-7):H01L21/302;H01L21/461 主分类号 H01L21/302
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