发明名称 |
Method of manufacturing a semiconductor device |
摘要 |
A method of manufacturing a semiconductor device provided with a first insulating film and a barrier film on a conductive region and an opening portion in the first insulating film and the barrier film, the method comprising the steps of: forming a first opening portion in the barrier film reaching the first insulating film; forming a second insulating film at least on the first insulating film in the first opening portion; and forming a second opening portion smaller than the first opening portion and reaching the conductive region by simultaneously boring a hole into the first insulating film and the second insulating film in the first opening portion.
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申请公布号 |
US2002039837(A1) |
申请公布日期 |
2002.04.04 |
申请号 |
US20010908496 |
申请日期 |
2001.07.19 |
申请人 |
TOHDA TOSHIYUKI;ARII ISAKU |
发明人 |
TOHDA TOSHIYUKI;ARII ISAKU |
分类号 |
H01L21/302;H01L21/28;H01L21/3065;H01L21/311;H01L21/768;(IPC1-7):H01L21/302;H01L21/461 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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