| 摘要 |
To test the vacuum inside the tube of a vacuum switch a contact travel below the nominal travel is selected and the high voltage occurring between the contents is monitored and the X-ray emission resulting from the operation of one of the contacts of an anode is measured. The values obtained are processed by a circuit to indicate the degree of vacuum. The method can be used for SF6 insulated switchgear, the breakdown resistance being tested. The nominal contact travel value is selected according to the material used for the contacts, value being between 1 and 8 mm e.g. 3 mm. The dc voltage is between 30 and 100 kV e.g. about 57 kV, the current being less than 12 mA. The ac voltage is between 25 and 70 kV eff, e.g. 40 kV, and the current is less than 3 mA. The X-ray detector can be a Geiger counter and the evaluating circuit uses a micropressor with software.
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| 申请人 |
SIEMENS AG, 8000 MUENCHEN, DE |
发明人 |
HESS, DR., RUEDIGER, W-1000 BERLIN 28, DE;SCHILLING, WOLFGANG, W-8522 HERZOGENAURACH, DE;SCHLENK, DR., WOLFGANG, W-8520 ERLANGEN, DE;KUHL, WILFRIED, W-8508 WENDELSTEIN, DE;TRENTIN, DIPL.-ING. (FH), PETER, W-6095 GUSTAVSBURG 1, DE;SCHRAMM, DR., HEINZ-HELMUT, W-1000 BERLIN 22, DE;KLUG, LEONHARD, W-8520 ERLANGEN, DE;WEBER, DIPL.-ING. (FH), HERIBERT, W-6000 FRANKFURT/MAIN 60, DE |
