| 摘要 |
PROBLEM TO BE SOLVED: To execute a test program by the same operation procedure even in different types of testing devices by reading a set value being stored in a data region in advance when executing a functional test and setting a corresponding timing edge generation circuit. SOLUTION: A tester processor 10 does not directly perform specific setting operation even for a shared resource type semiconductor-testing device when executing the statement of a test execution program for setting the concrete value of a timing edge ACLK1 and stores a set value '10μs' at a data region corresponding to the ACLK1 temporarily. Therefore, the operation procedure of the tester processor 10 when executing the statement is the same regardless of the shared resource type and per-pin type, thus setting equal the operation procedure of the hardware such as a corresponding timing generator 20 when executing the same statement. Therefore, testing conditions can be made equal for both types and testing reliability can be improved.
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