| 摘要 |
PURPOSE:To obtain a circuit test system which can read data from or write data into a memory by a single circuit either for external synchronous operation or system synchronous operation. CONSTITUTION:A circuit testing system 11 comprises a memory 13, a trigger signal supplying means 15, a control signal generating means 17 and a data sending means 19. The memory 13 stores test pattern data TP. The trigger signal supplying means 15 synchronizes a strobe signal SB from DUT with a master clock MC to generate an external trigger signal TGa. The trigger signal supplying means 15 selectively outputs TGa at the time of external synchronous operation. The control signal generating means 17 generates a control signal Sr synchronized with MC based on TGa. After a test pattern signal read from the memory 13 is temporarily stored in the data sending means 19 by this Sr, it is output to DUT with timing synchronous with SB. |
