发明名称 Plasma etching method and plasma etching apparatus
摘要 A plasma etching method includes the steps of forming an etching mask on a work piece, forming a patterned film, made of a material having an etching rate of 80% or more to 120% or less based on an etching rate for the work piece, on the work piece having the etching mask thereon, and etching the work piece and the patterned film formed thereon at the same time by use of a reactive gas plasma, wherein the film is formed with such a thickness that the thickness of a remaining portion of the film is equal to zero or more after the work piece is etched to a desired depth.
申请公布号 US6165907(A) 申请公布日期 2000.12.26
申请号 US19970850700 申请日期 1997.05.02
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 YONEDA, IKUO;KANAI, HIDEKI;ITO, SHINICHI
分类号 G03F1/00;H01L21/3065;(IPC1-7):H01L21/302;H01L21/461 主分类号 G03F1/00
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