发明名称 Process and device for measuring the amount of impurities in a gas sample to be analyzed
摘要 Provided is a process for measuring the amount of impurities in a gas sample filling a laser absorption spectroscopy analysis cell. The process includes calculating the value of a characteristic representative of the absorbance of the gas sample, from a measurement of the gas sample at a single given pressure, and quantifying the impurities on the basis of a predetermined law for the variation of the characteristic as a function of the amount of impurities. The characteristic is the ratio of the difference between the luminous intensity (Iana) of a light beam transmitted through the gas and the luminous intensity (Iref) of the incident beam to the luminous intensity (Iref) of the incident beam. The impurities are quantified on the basis of a value of the coefficient of proportionality between the amount of impurities and the characteristic, determined on the basis of a table of variation of the characteristic as a function of pressure, for a given amount of impurities.
申请公布号 US6341521(B1) 申请公布日期 2002.01.29
申请号 US19990416758 申请日期 1999.10.12
申请人 L'AIR LIQUIDE, SOCIETE ANONYME POUR L'ETUDE ET L'EXPLOITATION DES PROCEDES GEORGES CLAUDE 发明人 BARTOLOMEY MéLANIE;GIRARD JEAN-MARC;MAUVAIS PATRICK;MCANDREW JAMES
分类号 G01N21/11;G01N21/31;G01N21/35;G01N21/39;(IPC1-7):G01N21/11 主分类号 G01N21/11
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