发明名称 DESIGN QUALITY CHECK SYSTEM FOR SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a design quality check system for semiconductor integrated circuit capable of objectively grasping and managing the quality level of respective function blocks in order to improve the efficiency of the whole design and the reliability. SOLUTION: A verification result VR is analyzed to select a category to be checked in a category selection process 1. The category is analyzed on a syntax check reference of HDL in an HDL syntax check process 19, analyzed based on a physical design facilitation check reference 3c in a physical design facilitation check process 21, and analyzed based on a test design facilitation check reference 3d in a test design facilitation check process 22. The result determined in each check process 19-22 is stored as quality recording information in a determination result storage process 4. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004362397(A) 申请公布日期 2004.12.24
申请号 JP20030161953 申请日期 2003.06.06
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 FUJIMURA KATSUYA
分类号 G06F17/50;(IPC1-7):G06F17/50 主分类号 G06F17/50
代理机构 代理人
主权项
地址