Apparatuses, integrated circuits, and methods for testmode security systems

摘要

Apparatuses, integrated circuits, and methods are disclosed for testmode security systems. In one such example apparatus, a data storage is configured to store data. A testmode security system is configured to allow a user to access one or more testmodes of the apparatus at least partially responsive to the data storage not storing sensitive data and disallow the user from accessing the one or more testmodes of the apparatus at least partially responsive to the data storage storing sensitive data.

主权项

1. An apparatus, comprising: a data storage configured to store data; a testmode security system configured to determine if the data storage is storing sensitive data and allow a user to access a testmode of the apparatus at least partially responsive to the data storage not storing sensitive data and controls access to the testmode of the apparatus at least partially responsive to the data storage storing sensitive data; and a master control circuit coupled to the testmode security system, wherein the master control circuit is configured to provide a master control signal to the testmode security system responsive to receiving a logic high signal, wherein the testmode security system is further configured to allow the user to access the testmode regardless of the testmode security system determining the data storage is storing sensitive data or the data storage is not storing sensitive data at least partially responsive to receiving the master control signal from the master control circuit; wherein the master control circuit comprises a bondpad; and wherein the bondpad is bonded to a reference voltage through a bondwire.