| 摘要 |
PURPOSE: A semiconductor element test system and a control method thereof are provided to improve a performance of a testing operation of a semiconductor element by separately forming a loading and unloading operation part and a testing part of a handler. CONSTITUTION: A plurality of trays receive semiconductor elements to be tested and are loaded on loading sections(110,210). Unloading sections(120,220) classify and mount tested semiconductor elements on a tray according to a test result. Exchangers(130,230) again mount the semiconductor elements to be tested from the loading sections(110,210) to a test tray and separates the tested semiconductor elements from a test tray conveyed from a test site. Picker robots(140,240) conveys the semiconductor elements the loading sections(110,210), the unloading sections(120,220), and the exchangers(130,230). |
