发明名称 Multi-wavelength etalon
摘要 <p>A multi-wavelength etalon comprises at least two regions (38,39) with different indices of refraction (r1,r2). The change in refractive index alters the wavelengths of incident light as it enters the etalon, and thus the number of wavelengths between the reflective surfaces of the etalon, and therefore the etalon's transmission characteristics. By selecting specific indices of refraction, an etalon can be provided which produces peaks and troughs at preselected wavelengths in each region. The transition between two adjacent regions with different indices of refraction can be graded to reduce optical interference which may result from an abrupt transition. &lt;IMAGE&gt;</p>
申请公布号 EP1102046(A1) 申请公布日期 2001.05.23
申请号 EP20000309834 申请日期 2000.11.06
申请人 AGERE SYSTEMS OPTOELECTRONICS GUARDIAN CORPORATION 发明人 O'BRIEN, STEPHEN
分类号 G02B5/28;G01J3/26;(IPC1-7):G01J3/26 主分类号 G02B5/28
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