发明名称 MULTI-STEP CHEMICAL MECHANICAL POLISHING OF A GATE AREA IN A FINFET
摘要 A method of manufacturing a MOSFET type semiconductor device includes planarizing a gate material layer (320) that is deposited over a channel. The planarization is performed in a multi-step process that includes an initial "rough" planarization and then a "fine" planarization. The slurry used for the finer planarization may include added material that tends to adhere to low areas of the gate material.
申请公布号 WO2004112105(A3) 申请公布日期 2005.02.24
申请号 WO2004US17724 申请日期 2004.06.05
申请人 ADVANCED MICRO DEVICES, INC.;ACHUTHAN, KRISHNASHREE;AHMED, SHIBLY, S.;WANG, HAIHONG;YU, BIN 发明人 ACHUTHAN, KRISHNASHREE;AHMED, SHIBLY, S.;WANG, HAIHONG;YU, BIN
分类号 C09G1/02;H01L21/3105;H01L21/321;H01L21/336;H01L29/423;H01L29/49;H01L29/786 主分类号 C09G1/02
代理机构 代理人
主权项
地址