发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
摘要 In a semiconductor device including: an insulating film (6) formed over a substrate (1); a buried metal interconnect (10) formed in the insulating film (6); and a barrier metal film (A1) formed between the insulating film (6) and the metal interconnect (10), the barrier metal film (A1) includes a metal oxide film (7), a metal compound film (8) and a metal film (9) stacked in this order from a side in which the insulating film (6) exists to a side in which the metal interconnect (10) exists. Elastic modulus of the metal compound film (8) is larger than that of the metal oxide film (7).
申请公布号 EP1780788(A1) 申请公布日期 2007.05.02
申请号 EP20050741631 申请日期 2005.05.20
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 IKEDA, A.;NAKAGAWA, H.;AOI, NOBUO
分类号 H01L21/768;H01L21/285;H01L21/3205 主分类号 H01L21/768
代理机构 代理人
主权项
地址