发明名称 WAFER GENERATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a wafer generation method capable of efficiently generating a wafer from an ingot.SOLUTION: A wafer generation method for generating a wafer from a hexagonal single crystal ingot comprises a separation starting point formation step of positioning a condensation point of a laser beam in a wavelength having permeability to the hexagonal single crystal ingot to a depth equivalent to the thickness of the wafer to be generated from the surface of the ingot, irradiating the surface of the ingot with the laser beam by relatively moving the condensation point and the hexagonal single crystal ingot, and forming a separation starting point composed of a modified layer parallel to the surface and a crack extending along a c surface from the modified layer. The separation starting point formation step includes: a first separation starting point formation step of scanning the laser beam in a forward path and a backward path from the scan start point to the scan end point of the ingot; and a second separation starting point formation step of starting scanning from the scan end point and scanning the laser beam in the forward path and the backward path to the scan start point.SELECTED DRAWING: Figure 12
申请公布号 JP2016146446(A) 申请公布日期 2016.08.12
申请号 JP20150023576 申请日期 2015.02.09
申请人 DISCO ABRASIVE SYST LTD 发明人 HIRATA KAZUYA;NISHINO YOKO;TAKAHASHI KUNIMITSU
分类号 H01L21/304;B23K26/53 主分类号 H01L21/304
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