发明名称 MEASURING INSTRUMENT FOR SEMICONDUCTOR ELEMENT
摘要 PURPOSE:To prevent wrong sorting by detecting a current and a voltage which are applied and making measurement results ineffective unless their values are within a specific range. CONSTITUTION:An applied current detecting circuit 30 detects values of a collector and a base current applied from a measurement voltage applying circuit 11 and a base driving circuit 14 to a transistor (TR) 12 to be measured and supplies the detected values to a control circuit 19. The circuit 19 compares the detected current values with reference collector and base current values set according to the output voltages of the circuits 11 and 14 and values of resistances 13 and 15. When the detected values are not within the specific values of the reference values, it is judged that the TR12 is applied with an abnormal current, and the circuit 19 outputs a signal indicating the current sorting signal is ineffective to a sorting device. Thus, wrong sorting due to a defect in current application is prevented.
申请公布号 JPS61155873(A) 申请公布日期 1986.07.15
申请号 JP19840276190 申请日期 1984.12.28
申请人 TOSHIBA CORP 发明人 TAKAYAMA HOZUMI
分类号 G01R31/26 主分类号 G01R31/26
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