发明名称 SOR exposure system and method of manufacturing semiconductor devices using same
摘要 In an SOR exposure system for transferring patterns on masks to semiconductor wafers by using SOR radiation reflected by an X-ray reflecting mirror, a first shutter device for shielding at least gamma rays and a second shutter device for shielding X-rays are provided between the SOR ring and the mirror inside a beam port, and an exposure adjustment device for adjusting the amount of exposure when a circuit pattern on a mask is transferred to a wafer is provided between the mirror and the wafer. As a result, the human body can be protected against radiation rays, such as gamma rays, generated from the SOR ring when electrons are implanted thereto or when the SOR ring is stopped. Damage to the X-ray reflecting mirror caused by radiation rays is reduced, and stable reflectance of the mirror can be obtained. Maintenance of the SOR exposure system is also made easier.
申请公布号 US5581590(A) 申请公布日期 1996.12.03
申请号 US19940272374 申请日期 1994.07.06
申请人 CANON KABUSHIKI KAISHA 发明人 MORI, MAKIKO;OZAWA, KUNITAKA;AMEMIYA, MITSUAKI
分类号 G03F7/20;H01L21/027;(IPC1-7):G21K5/00 主分类号 G03F7/20
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