| 摘要 |
PROBLEM TO BE SOLVED: To obtain a picture information processing device which detects defects from an examination object picture without using a golden device or CAD data and without requiring much processing time like the FET method. SOLUTION: The picture information processing device which uses a picture to perform examination, recognition, and discrimination of an object is provided with a two-dimensional wavelet conversion means S1 which performs two-dimensional wavelet conversion of input digital picture, a binarization processing means S2 which applies threshold processing to longitudinal line detection components and lateral line detection components obtained by two-dimensional wavelet conversion to generate binary pictures of longitudinal line detection components and lateral line detection components, and a square Hough conversion means S3 which applies square Hough conversion for square detection to binary pictures obtained by the binarization processing means to obtain the position and the size of the object.
|
