| 摘要 |
PURPOSE: A data transfer method of a semiconductor device and a device thereof is provided to use global write data lines used at a data write operation and global read data lines used at a data read operation as read data lines at a multi-bit parallel test operation and other write data lines at a multi-bit parallel test write. CONSTITUTION: At a multi-bit parallel test read operation, multi-bit data to be compared is output through global read data lines(rd1,rd2) transferring read data at a normal read mode and global write data lines(wd1,wd2) transferring write data at a normal write operation, and then output data values are compared at the same time. A compared result is output to the exterior. At a multi-bit test write operation, write data is transferred to a cell array block through test-dedicated write data lines(wd_test) different from the write data lines.
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