发明名称 EPITAXIAL WAFER, SEMICONDUCTOR LIGHT-EMITTING ELEMENT, LIGHT-EMITTING DEVICE AND MANUFACTURING METHOD OF EPITAXIAL WAFER
摘要 PROBLEM TO BE SOLVED: To provide an epitaxial wafer capable of improving optical output while reducing a forward voltage by intentionally generating no threading dislocation.SOLUTION: The epitaxial wafer includes: a c-plane GaN substrate; an n-type conductive layer which is formed over a principal surface at one side of the c-plane GaN substrate; and a luminescent layer which is formed over the principal surface of the n-type conductive layer, and which includes a multi quantum well layer including a quantum well layer and a barrier layer which are laminated alternately. The quantum well layer is constituted of a first InGaN layer, and the barrier layer includes a second InGaN layer which contains an In composition smaller than that of the first InGaN layer.SELECTED DRAWING: Figure 3
申请公布号 JP2016136594(A) 申请公布日期 2016.07.28
申请号 JP20150011518 申请日期 2015.01.23
申请人 MITSUBISHI CHEMICALS CORP 发明人 OUCHI YOICHIRO;KURIHARA KO
分类号 H01L33/32;H01L33/06;H01L33/12;H01L33/16;H01L33/50 主分类号 H01L33/32
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