发明名称 |
EPITAXIAL WAFER, SEMICONDUCTOR LIGHT-EMITTING ELEMENT, LIGHT-EMITTING DEVICE AND MANUFACTURING METHOD OF EPITAXIAL WAFER |
摘要 |
PROBLEM TO BE SOLVED: To provide an epitaxial wafer capable of improving optical output while reducing a forward voltage by intentionally generating no threading dislocation.SOLUTION: The epitaxial wafer includes: a c-plane GaN substrate; an n-type conductive layer which is formed over a principal surface at one side of the c-plane GaN substrate; and a luminescent layer which is formed over the principal surface of the n-type conductive layer, and which includes a multi quantum well layer including a quantum well layer and a barrier layer which are laminated alternately. The quantum well layer is constituted of a first InGaN layer, and the barrier layer includes a second InGaN layer which contains an In composition smaller than that of the first InGaN layer.SELECTED DRAWING: Figure 3 |
申请公布号 |
JP2016136594(A) |
申请公布日期 |
2016.07.28 |
申请号 |
JP20150011518 |
申请日期 |
2015.01.23 |
申请人 |
MITSUBISHI CHEMICALS CORP |
发明人 |
OUCHI YOICHIRO;KURIHARA KO |
分类号 |
H01L33/32;H01L33/06;H01L33/12;H01L33/16;H01L33/50 |
主分类号 |
H01L33/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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