发明名称 POLISHING COMPOSITION CONTAINING CERIA ABRASIVE
摘要 The invention provides a chemical-mechanical polishing composition including first abrasive particles, wherein the first abrasive particles are wet-process ceria particles, have a median particle size of about 40 nm to about 100 nm, are present in the polishing composition at a concentration of about 0.005 wt.% to about 2 wt.%, and have a particle size distribution of at least about 300 nm, a functionalized heterocycle, a pH-adjusting agent, and an aqueous carrier, and wherein the pH of the polishing composition is about 1 to about 6. The invention also provides a method of polishing a substrate, especially a substrate comprising a silicon oxide layer, with the polishing composition.
申请公布号 WO2016140968(A1) 申请公布日期 2016.09.09
申请号 WO2016US20261 申请日期 2016.03.01
申请人 CABOT MICROELECTRONICS CORPORATION 发明人 REISS, Brian;SAUTER VAN NESS, Dana;LAM, Viet;HAINS, Alexander;KRAFT, Steven;JIA, Renhe
分类号 C09K3/14;H01L21/304;H01L21/306 主分类号 C09K3/14
代理机构 代理人
主权项
地址