发明名称 POLISHING HEAD AND POLISHING APPARATUS USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a polishing head that can increase the degree of planarization on a wafer surface after a wafer is polished, and at the same time can prevent damage in a semiconductor wafer or a head body, and to provide a polishing apparatus using the polishing head. SOLUTION: The polishing head (an upper surface plate 1) has the head body 4 having a recess 4a for retaining a semiconductor wafer W inside, and a membrane 5 for forming pressure space 6 in the recess 4a mounted to the head body 4 and for pressure-welding the semiconductor wafer W onto polishing cloth 56. In this case, the membrane 5 is formed by an elastic material having a wafer press surface 5a that closely comes into contact with an entire surface to be pressed while the wafer is being polished, and at the same time is parallel with a polishing surface 56a of the polishing cloth 56, and a projection 7 for positioning the semiconductor wafer W in a wafer diametric direction is provided on the wafer press surface 5a of the membrane 5.
申请公布号 JP2002270551(A) 申请公布日期 2002.09.20
申请号 JP20010069880 申请日期 2001.03.13
申请人 TOSHIBA CERAMICS CO LTD 发明人 IKEDA MASATOSHI;KOJIMA KATSUYOSHI
分类号 B24B37/04;B24B37/30;H01L21/304 主分类号 B24B37/04
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