发明名称 System for the non-destructive testing of the internal structure of objects
摘要 The invention relates to a system for the non-destructive testing of the internal structure of objects. The system comprises an object support, an X-ray generator and means for the detection of the attenuated X-ray beam from the object. The system also comprises means for controlling the successive displacements of the support relative to a fixed reference mark in such a way that the incident beam scans a sectional plane of the object, and means for processing the signals from the detection means for the purpose of displaying a section of the object in the sectional plane, the generator and detection means being fixed with respect to the reference mark. Application to the inspection and testing of objects by X-rays.
申请公布号 US4600998(A) 申请公布日期 1986.07.15
申请号 US19820412143 申请日期 1982.08.27
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE 发明人 HUET, JACQUES
分类号 A61B6/04;G01N23/08;G01N23/18;G01T1/166;(IPC1-7):G01N23/02;G01B15/06 主分类号 A61B6/04
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