发明名称 SEMICONDUCTOR MEMORY DEVICE FABRICATED ON A SINGLE SEMICONDUCTOR MEMORY CHIP
摘要 A semiconductor memory device has regular memory cells (RC1 - RCm) arranged in rows and columns, and, when one of the regular memory cells in a row is defective, the row is replaced with redundant memory cells (RCr - RCs). A fuse element (34) is then broken so as to isolate the power supply line (BL1/BLn) associated with the row from the main power supply line (GND) so that a defective memory cell does not consume any current, thereby improving the power consumption of the semiconductor memory device, and avoiding the need to reject the device due to large current consumption. <IMAGE>
申请公布号 KR960005367(B1) 申请公布日期 1996.04.24
申请号 KR19910020398 申请日期 1991.11.16
申请人 NIPPON ELECTRIC K.K. 发明人 GOBAYASHI, YASUO
分类号 G11C11/413;G11C11/401;G11C11/407;G11C29/00;G11C29/04;(IPC1-7):G11C29/00;G06F11/20 主分类号 G11C11/413
代理机构 代理人
主权项
地址