SCANNING ELECTRON MICROSCOPE,申请号JP19950130019-传众专利搜索

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发明名称	SCANNING ELECTRON MICROSCOPE
摘要
申请公布号	JPH08329873(A)	申请公布日期	1996.12.13
申请号	JP19950130019	申请日期	1995.05.29
申请人	HITACHI LTD	发明人	OUCHI YASUO;KUROSAKI TOSHISHIGE
分类号	H01J37/20;H01J37/28;(IPC1-7):H01J37/20	主分类号	H01J37/20
代理机构		代理人
主权项
地址

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