| 摘要 |
PROBLEM TO BE SOLVED: To provide an integrated circuit tester which inspects the validity of a parameter value simultaneously by inputting the value by a test program producer. SOLUTION: A testing part 204 executes the test of an integrated circuit according to a set parameter value. Test program forming means 207 of a central controller 201 forms a test program 206 by using information input via an operator console 202. If the parameter value for deciding the testing conditions of the part 204 is input via the console 202, the validity of whether the parameter value is the parameter capable of setting to the part 204 or not is inspected, and if it is not the parameter capable of setting to the part 204, the reinput of the parameter value is requested. |
