| 发明名称 |
SELF-REPAIRING INTERCONNECTIONS FOR ELECTRICAL CIRCUITS |
| 摘要 |
A self-repairing interconnection system and methods for forming the system are disclosed. The system includes a metal pathway adjacent a metal-doped chalcogenide material. The system is configured to repair defects in the metal pathway by donating metallic ions from the metal-doped chalcogenide material to the metal pathway.
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| 申请公布号 |
US2002000666(A1) |
申请公布日期 |
2002.01.03 |
| 申请号 |
US19990386789 |
申请日期 |
1999.08.31 |
| 申请人 |
KOZICKI MICHAEL N. |
发明人 |
KOZICKI MICHAEL N. |
| 分类号 |
H01L23/525;H01L23/532;(IPC1-7):H01L23/48;H01L23/52;H01L29/40 |
主分类号 |
H01L23/525 |
| 代理机构 |
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